Title: Semiconductor Mosaic Imaging

Date: 03 March 2014


Semiconductor Mosaic Imaging


    
Imaging large scale integrated devices for design and diagnostic
purposes
is facilitated by mosaic automation techniques applied to
compound optical microscopes


It is important that the highest possible resolution of detail is related
precisely with the overall structure of the device under examination
and recorded for repeated referencat any time

Cambridge Technology Systems offers this instrumentation in modular
form to cater for the user's particular requirements 
at the lowest
possible cost cosistent with the overall performance specification
Complementary techniques are also described on our instruments
website

             www.camtecsystems.com 

Enquiries or information about any aspect of this summary may be
obtained by phone - 01223 892020 or email - camtec@archivelabs.co.uk