Title: Semiconductor Mosaic Imaging

Date: 03 March 2014

Semiconductor Mosaic Imaging

Imaging large scale integrated devices for design and diagnostic
purposes is facilitated by mosaic automation techniques applied to
compound optical microscopes

It is important that the highest possible resolution of detail is related
precisely with the overall structure of the device under examination
and recorded for repeated reference at any time

Cambridge Technology Systems offers this instrumentation in modular
form to cater for the user’s particular requirements at the lowest
possible cost consistent with the overall performance specification.
Complementary techniques are also described on our instruments


Enquiries or information about any aspect of this summary may be
obtained by phone – 01223 892020 or email – camtec@archivelabs.co.uk